Nanoscale Optoelectronic Properties of EL Polymer Investigated by SPM
碩士 === 國立清華大學 === 材料科學工程學系 === 92 === We report nanoscale morphological influences on optoelectronic properties investigated by conducting atomic force microscopy (CAFM) and scanning near-field optical microscopy (SNOM). The CAFM is operated with positive tip bias to get synchronously topography and...
| Main Authors: | , |
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| Format: | Others |
| Language: | en_US |
| Published: |
2004
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| Online Access: | http://ndltd.ncl.edu.tw/handle/69437108617237162153 |