Study on the Establishment of Hazardous Energy Source Lockout/Tagout Management System for Silicon Wafer Manufacturing Industry

• Main Author: 程群傑
• Other Authors: Edward Chang
• Format: Others
• Language: zh-TW
• Published: 2004
• Online Access: http://ndltd.ncl.edu.tw/handle/88525074808919999493

碩士 === 國立交通大學 === 工學院碩士在職專班產業安全與防災學程 === 92 === According to US OHSA historic database, there were a lot of injuries caused by improper isolation hazardous energy sources. In most of these injury cases, operators, maintenance engineers, or contractors were hurt with laceration, scratch, hit, cut, puncture or even fatality due to the improper isolation. The average lost workdays per case was twenty-four days. The major reasons for the above-mentioned injuries was due to the energy sources was not effectively released, isolated or tagged with warning sign. Since there is a lack of statistics in Taiwan industry, preventive measures and appropriate trainings on Lockout/Tagout practice, this study on presents the first practice of this subject in Taiwan industry. The data of this study were collected from a local eight inches silicon wafer manufacturer, which is an US & Taiwan Joint Venture Company founded in 1996. The company produced the first eight inches silicon ingot in February 1996 and started to ship products to customers IC makers mainly in Taiwan. In February 2004, the Company becomes 100% owned by the US shareholders. Due to the limited available literatures on Lockout/Tagout management in Taiwan, I benchmarked my workplace’s safety guideline- CONTROL OF HAZARDOUS ENERGY（LOCKOUT）PROCESS with US OSHA regulations, SEMI Standards, local and international academic institutes, industries & personal protective equipment suppliers to establish the management study on the lockout/tagout of hazardous energy for the high-tech factories. This study shows that the silicon wafer manufacturer lost 124 workdays during 1997 to 1999 due to injuries caused by not adopting logout/tagout process. After introducing the lockout/tagout process in 2000, no more re-occurrence injuries happened from 2000 to 2003. It proves that lockout/tagout process is highly helpful in enhancing the safety management performance for the silicon wafer manufacturer.