| Summary: | 碩士 === 國立交通大學 === 管理學院碩士在職專班工業工程與管理組 === 92 === Since both technology development and current mass production methods use the same fabrication facilities, it is the aim of this paper to probe global optimization benefits linking R&D and the Fab.
The study utilizes X-factor theory to construct an R&D engineering run cycle time reduction model, using real world data to test the model. Consequently, the research can be used to shorten R&D cycle time and show Fab-run R&D Lot on-time delivery performance for new R&D technology. The company can then take advantage of these key factors thereby managing and improving operational performance in the semiconductor industry.
The strategy generates a methodology that calculates R&D cycle times, designs the KPI, constructs a model for R&D cycle time reduction, and finally, to strives for continuous improvement using the SPC chart as a monitoring mechanism. The major indices used are the X-factor (XFab), which tracks a Fab''s on-time delivery performance for new R&D technology, and the F-factor which tracks new R&D technology manufacturing maturity processes and lot inventory costs.
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