Estimation on Interface Phenomenon of Electrode Using Atomic Force Microscopy and Its Applications
碩士 === 國立成功大學 === 醫學工程研究所碩博士班 === 92 === Atomic force microscopy is a powerful tool to measure the nano-scale things and phenomenon. And many macroscopic circumstances come from the micro or nano-scale changes. In this study, we want to measure the electrical double layer to quantify the efficienc...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | en_US |
| Published: |
2004
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| Online Access: | http://ndltd.ncl.edu.tw/handle/98860288741962540295 |