Estimation on Interface Phenomenon of Electrode Using Atomic Force Microscopy and Its Applications

• Main Authors: Chun-Hsun Lin, 林俊勳
• Other Authors: Hsien-Chang Chang
• Format: Others
• Language: en_US
• Published: 2004
• Online Access: http://ndltd.ncl.edu.tw/handle/98860288741962540295

碩士 === 國立成功大學 === 醫學工程研究所碩博士班 === 92 === 　　Atomic force microscopy is a powerful tool to measure the nano-scale things and phenomenon. And many macroscopic circumstances come from the micro or nano-scale changes. In this study, we want to measure the electrical double layer to quantify the efficiency of FET-flow of capillary electrophoresis (CE) chip. The motion of electroosmotic flow (EOF) in CE chip comes from the interaction between applied electric field and zeta (ζ) potential that form the body force to drive the liquid in the microchannel. The regulation way of EOF can be easily achieved by applying an additional electric field on the outer surface of the capillary. In order to precisely control the fluid in microchannel, the value and the range of ζ potential should be quantified. In this study, we use atomic force microscopy (AFM) to measure the different electrical double layer induced by applying perpendicular potential directly. The results show that the correlation between two methods (AFM and current monitoring method) to measure the ζ potential of the 18-ODT-Au electrode is good (R2 = 0.983). The proposed approach provides a tool to evaluate the efficiency of induced voltage in different materials and buffer solutions. With understanding of this interface phenomenon, we wish to control the microfluid more precisely in the biochip.