Photoreflectance Studies of the Surface Property of InAlAs Surface-Intrinsic-P+ structures
碩士 === 國立成功大學 === 物理學系碩博士班 === 92 === Modulation spectroscopy of Photoreflectance (PR) is widely used to study and characterize bulk semiconductors and semiconductor microstructures. PR is particularly useful for characterizing devices , since it is not only nondestructive and contactless , but ca...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | zh-TW |
| Published: |
2004
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| Online Access: | http://ndltd.ncl.edu.tw/handle/33031880313882200370 |