Effects of M6+ and W6+ doping onthe Ferroelectric properties of(Bi,Pr)4Ti3O12Films
碩士 === 國立成功大學 === 材料科學及工程學系碩博士班 === 92 === Effects of the annealing process and Mo- and W-doping as a function of the dopant concentration on the microstructures and ferroelectricity of sputter-deposited Bi4-xPrxTi3O12 (BPT) films on Pt/SiO2/Si(100) were studied. The remanent polarization (2Pr) Of...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | zh-TW |
| Published: |
2004
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| Online Access: | http://ndltd.ncl.edu.tw/handle/21064454553054366858 |