Water/Oxygen Barrier Coatings on Polyethersulfone Substrates by Plasma-Enhanced Chemical Vapor Deposition

碩士 === 國立中興大學 === 材料工程學研究所 === 92 === Traditional flat panel displays were built on the glasses substrate. But they do not have impact-resistance, flexibility and have the high weight and thickness. Recently, using plastic materials substrate becomes a trend in the present development to...

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Main Authors: Wun-Chi Lo, 羅文池
Other Authors: Dong-Sing Wuu
Format: Others
Language:zh-TW
Published: 2004
Online Access:http://ndltd.ncl.edu.tw/handle/87843275444213095334
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spelling ndltd-TW-092NCHU01590252015-10-13T16:26:50Z http://ndltd.ncl.edu.tw/handle/87843275444213095334 Water/Oxygen Barrier Coatings on Polyethersulfone Substrates by Plasma-Enhanced Chemical Vapor Deposition 以電漿輔助化學氣相沉積法在聚醚堸基材上研製水/氧氣阻障膜 Wun-Chi Lo 羅文池 碩士 國立中興大學 材料工程學研究所 92 Traditional flat panel displays were built on the glasses substrate. But they do not have impact-resistance, flexibility and have the high weight and thickness. Recently, using plastic materials substrate becomes a trend in the present development to study the flexible organic light-emitting devices (FOLED). However, the high permeation of water vapors and oxygen through polymer substrate is an important problem in the FOLED applications. Most of the commercial plastic substrates cannot resist the transmission of water vapor, which can easily cause a great damage inside the display and reduces the electron injection in the OLED structure and thereby drastically decreases its performance. To resolve this problem, a gas barrier layer must be developed on the plastic substrate. In this study, the SiOX and SiNX thin film was deposited on polyethersulfone (PES) plastic substrate by plasma-enhanced chemical vapor deposition (PECVD). Details of the effects of deposition parameters (flow ratio, chamber pressure, and rf power density, temperature, thickness) on the barrier film properties in terms of deposition rate, refractive index, roughness, etch rate, film structure, microstructure, adhesion, contact angle, flexibility, and WVTR/OTR were described, expecting for FOLED application as water/oxygen barrier layer. The transparency of the barrier layer can achieve over 80 % after coating silica and silicon nitride on PES. Under optimum conditions, the WVTR and OTR for PES can be reduced from a level of 28 g/m2/day and 243 cc/m2/day (bare substrate) to 0.1 g/m2/day and 0.18 cc/m2/day after coating silica. The WVTR and OTR for PES can be reduced to 0.01 g/m2-day and 0.01 cc/m2/day after coating silicon nitride. As a result of experiments, the deposition of SiOX and SiNX thin film on PES plastic substrate indeed resists the oxygen and water vapor transmission sufficiently. Dong-Sing Wuu 武東星 2004 學位論文 ; thesis 0 zh-TW
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description 碩士 === 國立中興大學 === 材料工程學研究所 === 92 === Traditional flat panel displays were built on the glasses substrate. But they do not have impact-resistance, flexibility and have the high weight and thickness. Recently, using plastic materials substrate becomes a trend in the present development to study the flexible organic light-emitting devices (FOLED). However, the high permeation of water vapors and oxygen through polymer substrate is an important problem in the FOLED applications. Most of the commercial plastic substrates cannot resist the transmission of water vapor, which can easily cause a great damage inside the display and reduces the electron injection in the OLED structure and thereby drastically decreases its performance. To resolve this problem, a gas barrier layer must be developed on the plastic substrate. In this study, the SiOX and SiNX thin film was deposited on polyethersulfone (PES) plastic substrate by plasma-enhanced chemical vapor deposition (PECVD). Details of the effects of deposition parameters (flow ratio, chamber pressure, and rf power density, temperature, thickness) on the barrier film properties in terms of deposition rate, refractive index, roughness, etch rate, film structure, microstructure, adhesion, contact angle, flexibility, and WVTR/OTR were described, expecting for FOLED application as water/oxygen barrier layer. The transparency of the barrier layer can achieve over 80 % after coating silica and silicon nitride on PES. Under optimum conditions, the WVTR and OTR for PES can be reduced from a level of 28 g/m2/day and 243 cc/m2/day (bare substrate) to 0.1 g/m2/day and 0.18 cc/m2/day after coating silica. The WVTR and OTR for PES can be reduced to 0.01 g/m2-day and 0.01 cc/m2/day after coating silicon nitride. As a result of experiments, the deposition of SiOX and SiNX thin film on PES plastic substrate indeed resists the oxygen and water vapor transmission sufficiently.
author2 Dong-Sing Wuu
author_facet Dong-Sing Wuu
Wun-Chi Lo
羅文池
author Wun-Chi Lo
羅文池
spellingShingle Wun-Chi Lo
羅文池
Water/Oxygen Barrier Coatings on Polyethersulfone Substrates by Plasma-Enhanced Chemical Vapor Deposition
author_sort Wun-Chi Lo
title Water/Oxygen Barrier Coatings on Polyethersulfone Substrates by Plasma-Enhanced Chemical Vapor Deposition
title_short Water/Oxygen Barrier Coatings on Polyethersulfone Substrates by Plasma-Enhanced Chemical Vapor Deposition
title_full Water/Oxygen Barrier Coatings on Polyethersulfone Substrates by Plasma-Enhanced Chemical Vapor Deposition
title_fullStr Water/Oxygen Barrier Coatings on Polyethersulfone Substrates by Plasma-Enhanced Chemical Vapor Deposition
title_full_unstemmed Water/Oxygen Barrier Coatings on Polyethersulfone Substrates by Plasma-Enhanced Chemical Vapor Deposition
title_sort water/oxygen barrier coatings on polyethersulfone substrates by plasma-enhanced chemical vapor deposition
publishDate 2004
url http://ndltd.ncl.edu.tw/handle/87843275444213095334
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