Distinguishement of Contribution Ratio in NBTI and HC Test of PMOSFET under Deep-Submicron Process
碩士 === 大葉大學 === 電機工程學系碩士班 === 92 === CMOS (Complementary Metal Oxide Semiconductor) devices applied to System on Chip (SOC) is becoming a trend in the future, and the most key technologies are how to grow up in the different oxide thicknesses and how to accept the variable bias voltages in IC operat...
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| Format: | Others |
| Language: | zh-TW |
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2004
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| Online Access: | http://ndltd.ncl.edu.tw/handle/g8rs5m |