High Speed 3-D Profilometry Utilizing Laser Diode Array
博士 === 中原大學 === 機械工程研究所 === 92 === A designing concept of laser diode array probe has been introduced which intends to develop an optical scanning device that is capable of measuring 3-D profiles with high speed and high precision. The probe consists of 100 laser lines emerged from 100 laser diodes...
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| Format: | Others |
| Language: | zh-TW |
| Published: |
2004
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| Online Access: | http://ndltd.ncl.edu.tw/handle/xc7mw8 |
| Summary: | 博士 === 中原大學 === 機械工程研究所 === 92 === A designing concept of laser diode array probe has been introduced which intends to develop an optical scanning device that is capable of measuring 3-D profiles with high speed and high precision. The probe consists of 100 laser lines emerged from 100 laser diodes and arranged in five rows. In general this measurement adopts the idea of multiple laser beam projections. The profile data of the specimen can be obtained simultaneously without needing any scanning mechanism. The beams projected onto the surface may cause difficulty in distinguishing them. This problem has been resolved by the electronic controls on the on/off sequences of the diode array light source. A profile may be obtained by projecting laser lines onto the surface simultaneous or single-line scanning the surface in serious or multi-line scanning in a specified order. Measurement time is dependent on the process of optical scanning. Single-line scanning usually take 3 seconds or less. Measurement resolution is dependent on the spacing between the projection lines and line projection angle. Experimental results show that an accuracy of 0.5 mm could be obtained for a measuring range of 200 × 150 mm2. So that a new 3-D profile measuring system could be expected in this probe to meet the needs of high speed and high precision 3-D profile measurement in the industry.
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