Timing Characterization of D-type Flip-Flops And Correspondent Analysis in Scan Chain

碩士 === 中華大學 === 電機工程學系碩士班 === 92 === The scan chain would be used widely by logic circuit, correct function of scan chain is more and more important, we use the random number to obtain vtn and vtp of CMOS in DFF and analysis the effect in DFF and the transition in DFF chain as the variati...

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Bibliographic Details
Main Author: 龍城郁
Other Authors: J.E.Chen
Format: Others
Language:zh-TW
Published: 2004
Online Access:http://ndltd.ncl.edu.tw/handle/66821495229133402360
Description
Summary:碩士 === 中華大學 === 電機工程學系碩士班 === 92 === The scan chain would be used widely by logic circuit, correct function of scan chain is more and more important, we use the random number to obtain vtn and vtp of CMOS in DFF and analysis the effect in DFF and the transition in DFF chain as the variation of vtn and vtp. The margin would small as the variation of vtn and vtp is big, that would effect the transition between two DFF.