On Nano- Indentation of Thin Films for Wafers with Interconnect in Deep Submicron:An Experimental and Theoretical Study

碩士 === 國立中正大學 === 機械系 === 92 === The mechanical property at nano-scale is central for the development of nanoscience and technology. Over the years, nanoindentation has evolved into a powerful means of determine the mechanical properties of thin films and surfaces in nanometer regimes. Up...

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Bibliographic Details
Main Authors: Hsin-Chi Cheng, 鄭新基
Other Authors: Yeau-Ren Jeng
Format: Others
Language:zh-TW
Published: 2004
Online Access:http://ndltd.ncl.edu.tw/handle/93417191612393474869

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