An Approach to Circular Hole Inspection of An X-Ray PCB Image Using Modular Active Contour

• Main Authors: Chia-Hao Wu, 吳家豪
• Other Authors: Yung-Sheng Chen
• Format: Others
• Language: zh-TW
• Published: 2003
• Online Access: http://ndltd.ncl.edu.tw/handle/39462800942215029696

碩士 === 元智大學 === 電機工程學系 === 91 === In the automatic optical inspection system, the performance is influenced by the adopted technology of image processing. In this thesis, we present a method to acquire whole information about circular holes automatically from the X-Ray image of a multi-layout printed circuit board（PCB）, and design a modular active contour to constraint the result close to the object. Two main stages desired in our approach include the segmentation of probably circular holes information and the accurate location of using modular active contour. The probably circular hole information are obtained by the analysis from the X-Ray image. Then, the probably circular hole information support the initial settings used in developed the modular active contour. According to the initial settings, modular active contour can carry out and push the initial model to locate closely the current circular hole. Experimental analyses have shown that the proposed approach obtains the performance of average error 0.5 pixel under 20% below random noise added. The experiments of real PCB images have also confirmed the feasibility of the proposed approach. Finally, the limitations and future works of the proposed method will also be discussed.