Modulation spectroscopy study of AlGaN films and ZnO nanorods
碩士 === 國立臺灣科技大學 === 電子工程系 === 91 === The optical properties of Al0.27Ga0.73N thin film grown on GaN by MOCVD have been characterized by contactless electroreflectance (CER) measurements in the temperature range of 15K∼300K. The quality of AlGaN films related to the growth temperature of t...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | zh-TW |
| Published: |
2003
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| Online Access: | http://ndltd.ncl.edu.tw/handle/42943076140725928718 |