Optical Studies of Microcavity Structures

• Main Authors: YU-HUAN CHOU, 周裕煥
• Other Authors: Ying-Sheng Huang
• Format: Others
• Language: zh-TW
• Published: 2003
• Online Access: http://ndltd.ncl.edu.tw/handle/36596417325896189054

碩士 === 國立臺灣科技大學 === 電子工程系 === 91 === Abstract We have characterized three different microcavity structures including resonant-cavity light emitting diode (RC-LED) and vertical cavity surface emitting laser (VCSEL) by surface photovoltage (SPV), differential surface photovoltage (DSPV), piezoreflectance (PzR), reflectance (R), and angle modulation reflectance (AMR) measurements. The AMR is used to study the cavity mode (ECM) for the first time. The experimental results show that maximum amplitude for quantum well transition (EQW) can be achieved by resonant alignment of EQW with ECM. The information about both ECM and EQW of RC-LED can be obtained by SPV and DSPV meansurements. From the angle dependent AMR spectra of VCSEL, we are able to obserbve the cavity-mode splitting. We propose that the cavity mode splitting is caused by the strong photon-exciton interaction which occurs while the cavity mode is tuned to be resonant with the excitonic transitions of the QWs placed at the maximum optical field intensity of the standing wave.