Mechanical Properties of MEMS Thin Films

碩士 === 國立臺灣大學 === 應用力學研究所 === 91 === This dissertation starts with mechanics of materials and basic theorem of electromagnetics and tries to design several kinds of test keys. With the combination of test keys and optical measurement system which can construct a complete measuring process. This proc...

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Bibliographic Details
Main Authors: Wu-Fone Yeh, 葉伍峰
Other Authors: K. C. Wu
Format: Others
Language:zh-TW
Published: 2003
Online Access:http://ndltd.ncl.edu.tw/handle/92968253381818118110