A Low-Cost Jitter Measurement Technique for BIST Applications
碩士 === 國立臺灣大學 === 電子工程學研究所 === 91 === In this paper, we present a technique to measure the RMS value of a signal’s period jitter. In the proposed approach, the signal under test is compared with two delayed versions of itself. The collected information corresponds to two points along the...
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| Format: | Others |
| Language: | zh-TW |
| Published: |
2003
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| Online Access: | http://ndltd.ncl.edu.tw/handle/27411289837132918341 |
| Summary: | 碩士 === 國立臺灣大學 === 電子工程學研究所 === 91 === In this paper, we present a technique to measure the RMS value of a signal’s period jitter. In the proposed approach, the signal under test is compared with two delayed versions of itself. The collected information corresponds to two points along the jitter’s cumulative distribution function (CDF) curve from which the RMS period jitter value can be derived. Currently, the spice simulation results show less than 5% error for RMS jitter values ranging from 20 to 60 ps.
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