Scanning probe microscopy Studies of GaN-based materials
碩士 === 國立海洋大學 === 光電科學研究所 === 91 ===
Main Author: | 蘇維軾 |
---|---|
Other Authors: | 林泰源 |
Format: | Others |
Language: | zh-TW |
Published: |
2003
|
Online Access: | http://ndltd.ncl.edu.tw/handle/00228902483766326516 |
Similar Items
-
Investigation of Surface Properties for Ga- and N-polar GaN using Scanning Probe Microscopy Techniques
by: Ferguson, Josephus Daniel, III
Published: (2013) -
Studies of GaN Islands by Scanning Electric Force Microscopy
by: Chung-I Huang, et al.
Published: (2005) -
Studied of GaN Surface Defects by Scanning Probe Measurements
by: Hung-Tse Chen, et al.
Published: (2003) -
Studies of micro-structures on GaN surface by scanning probe measurement
by: Chih-Wei Ho, et al.
Published: (2004) -
Scanned Probe Spectroscopy of Traps in Cross-Sectioned AlGaN/GaN Devices
by: Gleason, Darryl A.
Published: (2019)