A Timing Measurement Unit for Embedded Flash Memory
碩士 === 國立清華大學 === 電機工程學系 === 91 === A wide-range and scalable time-to-digital conversion (TDC) is presented and is applied to measure access time parameter for embedded flash memory in this paper. Based on principle of pulse stretching, the proposed TDC is composed of multi-stage time-to...
Main Authors: | Kae-Jiun Mo, 莫凱圳 |
---|---|
Other Authors: | Tsin-Yuan Chang |
Format: | Others |
Language: | en_US |
Published: |
2003
|
Online Access: | http://ndltd.ncl.edu.tw/handle/05969388335018209067 |
Similar Items
-
Embedded Cell Current Measurement Circuit for Flash Memories
by: Chien-Cheng Yu, et al.
Published: (2004) -
A File System for Flash Memory on Embedded System
by: Chih-Kai Chang, et al.
Published: (2008) -
An Access Time Measurement Unit of Embedded Memory
by: Shu Rong Lee, et al.
Published: (2002) -
Implementation of Embedded LINUX with NOR Flash Memory
by: Yuan-Hao Chang, et al.
Published: (2004) -
Flash-Memory Storage Systems for Embedded Systems
by: Li-Pin Chang, et al.
Published: (2003)