A Timing Measurement Unit for Embedded Flash Memory

碩士 === 國立清華大學 === 電機工程學系 === 91 === A wide-range and scalable time-to-digital conversion (TDC) is presented and is applied to measure access time parameter for embedded flash memory in this paper. Based on principle of pulse stretching, the proposed TDC is composed of multi-stage time-to...

Full description

Bibliographic Details
Main Authors: Kae-Jiun Mo, 莫凱圳
Other Authors: Tsin-Yuan Chang
Format: Others
Language:en_US
Published: 2003
Online Access:http://ndltd.ncl.edu.tw/handle/05969388335018209067