Z-scan Measurement of Optical nonlinearities of ZnO thin film
碩士 === 國立交通大學 === 光電工程所 === 91 === By utilizing femtosecond Kerr Mode-Locked Ti:sapphire laser as Z-scan light source, we have studied intensity dependent nonlinear refractive index of the ZnO thin film growth by Laser-MBE epitaxy. The two photon absorption coefficient β=1905 cm/GW, the t...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | en_US |
| Published: |
2003
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| Online Access: | http://ndltd.ncl.edu.tw/handle/41037216486699195967 |