An Intelligent Hybrid Approach to Optimal Characterization of Nanoscale MOSFET Devices
碩士 === 國立交通大學 === 資訊科學系 === 91 === Semiconductor model parameters extraction plays an important role between device foundries and integrated circuit (IC) design companies yet a bottleneck in microelectronics industry. Various compact models have been of great interest and studied for nanoscale metal...
| Main Authors: | , |
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| Format: | Others |
| Language: | en_US |
| Published: |
2003
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| Online Access: | http://ndltd.ncl.edu.tw/handle/91309223450509530793 |