An Intelligent Manufacturing Defect Detection Method for Time Issue
碩士 === 國立交通大學 === 資訊科學系 === 91 === In recent years, defect detection problem of the workshop has become an important issue for manufacturing domain. In order to raise the quality of the products, the root cause of the low-quality situations should be found out as soon as possible....
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | en_US |
| Published: |
2003
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| Online Access: | http://ndltd.ncl.edu.tw/handle/11979537706729337503 |