Using Process Capability IndexSpk to Construct the Bootstrap Confidence Interval for Process Yield
碩士 === 國立交通大學 === 工業工程與管理系 === 91 === Quality is an essential factor to enhance product’s competitive capability in the market. Statistical process control (SPC) is broadly used in controlling and improving process capability in industry. Control chart and process capability analysis are two importa...
| Main Authors: | , |
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| Format: | Others |
| Language: | zh-TW |
| Published: |
2003
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| Online Access: | http://ndltd.ncl.edu.tw/handle/05670644851660736859 |