A Study on the Plasma Diagnostic of PbZr0.54Ti0.46O3 Sputter Deposition

碩士 === 逢甲大學 === 材料科學所 === 91 === The properties and processing parameters of sputtering PZT ferroelectric thin film are closely linked. Therefore, two dual-target sets Pb/PZT and PbO/PZT were used to co-sputtering deposit PZT thin films on Si/SiO2/Ti/Pt substrates respectively to reveal how Pb comp...

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Bibliographic Details
Main Authors: Ming-Zhi Lin, 林明志
Other Authors: Ju-Liang He
Format: Others
Language:zh-TW
Published: 2003
Online Access:http://ndltd.ncl.edu.tw/handle/zm95ae

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