Correlation analysis for CMOS transistor mismatch and circuit performance estimation

碩士 === 中華大學 === 電機工程學系碩士班 === 91 === Abstract This thesis discussed the correlation analysis of MOS parameter variation effects the behavior of transistor mismatch current and analog integrated circuit. Traditional statistical simulation treat vary variables as independent of each oth...

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Bibliographic Details
Main Author: 戴于峻
Other Authors: Jwu-E Chen
Format: Others
Language:zh-TW
Published: 2003
Online Access:http://ndltd.ncl.edu.tw/handle/97556674459441025038
Description
Summary:碩士 === 中華大學 === 電機工程學系碩士班 === 91 === Abstract This thesis discussed the correlation analysis of MOS parameter variation effects the behavior of transistor mismatch current and analog integrated circuit. Traditional statistical simulation treat vary variables as independent of each other, due to MOS parameters are derived from common physical processes, they are correlated to a greater or lesser degree. Therefore we proposed a statistical simulation method permit a linear correlation coefficient to be defined between two parameters. Correlation analysis determines a circuit''s performance to obtain the accurately statistical simulation.