Plugging ink improvement study

碩士 === 元智大學 === 化學工程學系 === 90 === This study researches into the factors of the plugging ink crack when it is used in the print circuit board by high-temperatured procedure. We design a weight loss experiment. We can get the diffusion coefficient of plugging ink is 2.6*10-5...

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Bibliographic Details
Main Authors: Pao Yuan Lee, 李葆元
Other Authors: Shinn Gwo Hong
Format: Others
Language:zh-TW
Published: 2002
Online Access:http://ndltd.ncl.edu.tw/handle/46349284181784471377