Eigenvalue-based similarity measures and their applications for defect inspection
碩士 === 元智大學 === 工業工程與管理學系 === 90 === In this research, novel similarity measures are presented for automated defect inspection. Traditional normalized correlation approach has been extensively used as a similarity measure for pattern matching. However, it cannot provide good discrimination for det...
Main Authors: | Ron-Hwa Yang, 楊榮華 |
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Other Authors: | Du-Ming Tsai |
Format: | Others |
Language: | zh-TW |
Published: |
2002
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Online Access: | http://ndltd.ncl.edu.tw/handle/90763620803469634088 |
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