Eigenvalue-based similarity measures and their applications for defect inspection

碩士 === 元智大學 === 工業工程與管理學系 === 90 === In this research, novel similarity measures are presented for automated defect inspection. Traditional normalized correlation approach has been extensively used as a similarity measure for pattern matching. However, it cannot provide good discrimination for det...

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Bibliographic Details
Main Authors: Ron-Hwa Yang, 楊榮華
Other Authors: Du-Ming Tsai
Format: Others
Language:zh-TW
Published: 2002
Online Access:http://ndltd.ncl.edu.tw/handle/90763620803469634088