An improved normalized correlation for defect inspection
碩士 === 元智大學 === 工業工程與管理學系 === 90 === Pattern matching has been an important technique in machine vision for the applications of optical character recognition (OCR), object detection, motion analysis, and defect detection. Normalized correlation is the most common measure used for pattern matching. H...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | zh-TW |
| Published: |
2002
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| Online Access: | http://ndltd.ncl.edu.tw/handle/67682352383844398504 |