The Reflection Z-scan of Bi Thin Film
碩士 === 國立臺灣大學 === 物理學研究所 === 90 === Abstract Bi films were grown onto Corning 7059 Glass by pulsed laser deposition (PLD). And we measure the refractive indices and the thickness of the films by Spectrocscopic Ellipsometry and X-ray reflectivity, respectiv...
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2002
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| Online Access: | http://ndltd.ncl.edu.tw/handle/67103668914834550549 |
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ndltd-TW-090NTU001980582017-02-24T04:14:01Z http://ndltd.ncl.edu.tw/handle/67103668914834550549 The Reflection Z-scan of Bi Thin Film Bi薄膜反射式Z-scan非線性光學性質 Shing Dean Yu 游星鼎 碩士 國立臺灣大學 物理學研究所 90 Abstract Bi films were grown onto Corning 7059 Glass by pulsed laser deposition (PLD). And we measure the refractive indices and the thickness of the films by Spectrocscopic Ellipsometry and X-ray reflectivity, respectively. Then a focused laser beam was shone through the Bi films, and the reflection intensity of the laser beam was detected by using of Beam Splitter. We have successfully observed that the reflection intensity also varies as a function of the position of the films. And this kind of technique of measuring the optical nonlinearities is referred as “ Reflection Z-scan”. 陳銘堯 2002 學位論文 ; thesis 47 zh-TW |
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NDLTD |
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zh-TW |
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Others
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NDLTD |
| description |
碩士 === 國立臺灣大學 === 物理學研究所 === 90 === Abstract
Bi films were grown onto Corning 7059 Glass by pulsed laser deposition
(PLD). And we measure the refractive indices and the thickness of the
films by Spectrocscopic Ellipsometry and X-ray reflectivity, respectively.
Then a focused laser beam was shone through the Bi films, and the
reflection intensity of the laser beam was detected by using of Beam
Splitter. We have successfully observed that the reflection intensity also
varies as a function of the position of the films. And this kind of
technique of measuring the optical nonlinearities is referred as
“ Reflection Z-scan”.
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| author2 |
陳銘堯 |
| author_facet |
陳銘堯 Shing Dean Yu 游星鼎 |
| author |
Shing Dean Yu 游星鼎 |
| spellingShingle |
Shing Dean Yu 游星鼎 The Reflection Z-scan of Bi Thin Film |
| author_sort |
Shing Dean Yu |
| title |
The Reflection Z-scan of Bi Thin Film |
| title_short |
The Reflection Z-scan of Bi Thin Film |
| title_full |
The Reflection Z-scan of Bi Thin Film |
| title_fullStr |
The Reflection Z-scan of Bi Thin Film |
| title_full_unstemmed |
The Reflection Z-scan of Bi Thin Film |
| title_sort |
reflection z-scan of bi thin film |
| publishDate |
2002 |
| url |
http://ndltd.ncl.edu.tw/handle/67103668914834550549 |
| work_keys_str_mv |
AT shingdeanyu thereflectionzscanofbithinfilm AT yóuxīngdǐng thereflectionzscanofbithinfilm AT shingdeanyu bibáomófǎnshèshìzscanfēixiànxìngguāngxuéxìngzhì AT yóuxīngdǐng bibáomófǎnshèshìzscanfēixiànxìngguāngxuéxìngzhì AT shingdeanyu reflectionzscanofbithinfilm AT yóuxīngdǐng reflectionzscanofbithinfilm |
| _version_ |
1718416077575159808 |