The Reflection Z-scan of Bi Thin Film
碩士 === 國立臺灣大學 === 物理學研究所 === 90 === Abstract Bi films were grown onto Corning 7059 Glass by pulsed laser deposition (PLD). And we measure the refractive indices and the thickness of the films by Spectrocscopic Ellipsometry and X-ray reflectivity, respectiv...
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| Other Authors: | |
| Format: | Others |
| Language: | zh-TW |
| Published: |
2002
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| Online Access: | http://ndltd.ncl.edu.tw/handle/67103668914834550549 |
| Summary: | 碩士 === 國立臺灣大學 === 物理學研究所 === 90 === Abstract
Bi films were grown onto Corning 7059 Glass by pulsed laser deposition
(PLD). And we measure the refractive indices and the thickness of the
films by Spectrocscopic Ellipsometry and X-ray reflectivity, respectively.
Then a focused laser beam was shone through the Bi films, and the
reflection intensity of the laser beam was detected by using of Beam
Splitter. We have successfully observed that the reflection intensity also
varies as a function of the position of the films. And this kind of
technique of measuring the optical nonlinearities is referred as
“ Reflection Z-scan”.
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