THE SIZE OF SPHERICAL Si QUANTUM DOTS STUDIED BY RAMAN SCATTERING

碩士 === 國立臺灣師範大學 === 物理研究所 === 90 === THE SIZE OF SPHERICAL Si QUANTUM DOTS STUDIED BY RAMAN SCATTERING Spherical Silicon quantum dots which have been grown by thermal evaporation method were examined by Raman scattering, TEM and optical reflectivity measurements. The TEM patter...

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Bibliographic Details
Main Authors: yen hung ming, 顏弘洺
Other Authors: Chiact Chia
Format: Others
Language:zh-TW
Published: 2002
Online Access:http://ndltd.ncl.edu.tw/handle/45329727584191762440