Measurement of Oxide Charge and Interface Trap for MOSFET’s

Measurement of Oxide Charge and Interface Trap for MOSFET’s

碩士 === 國立清華大學 === 工程與系統科學系 === 90 ===

Bibliographic Details
Main Authors: Chun-Yuan Lu, 盧俊源
Other Authors: Kuei-Shu Chang-Liao
Format: Others
Language:zh-TW
Published: 2002
Online Access:http://ndltd.ncl.edu.tw/handle/73438664753430613001

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