X-Ray Diffraction Characterization of the Thermal Annealing Effects on InxGa1-xN-GaN MQWs
碩士 === 國立清華大學 === 工程與系統科學系 === 90 === We apply X-ray diffraction to characterize the structure of InxGa1-xN-GaN MQWs and study the effect of thermal-annealing from the structural point of view. Surface-normal (00.2) and (00.4) diffraction profiles were collected and analyzed by numerical...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | en_US |
| Published: |
2002
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| Online Access: | http://ndltd.ncl.edu.tw/handle/38270239579124966376 |