Fabrication and Characterization of M(Al)/(Ba0.5Sr0.5)TiO3/Si (p-type) Field-effect Transistors

碩士 === 國立清華大學 === 電子工程研究所 === 90 === N-channel metal-oxide-semiconductor field-effect-transistors (MOSFETs) using barium strontium titanate (Ba0.5,Sr0.5)TiO3 (BST) gate dielectric were successfully fabricated. The BST films are deposited by RF magnetron sputtering. The IDS-VDS and IDS-VGS...

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Bibliographic Details
Main Authors: Yu-Bin Tseng, 曾祐彬
Other Authors: Joseph Ya-Min Lee
Format: Others
Language:zh-TW
Published: 2002
Online Access:http://ndltd.ncl.edu.tw/handle/67026444622954515927