The Carrier Transport Properties in Horizontal Conjugated Polymer Devices
碩士 === 國立交通大學 === 物理研究所 === 90 === In order to solve the problem of the low carrier mobility in conjugated polymer, we use EBL(electron beam lithography) to fabricate the horizontal device with the electrodes parallel to electric current direction. The horizontal device is made up of Au/M...
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ndltd-TW-090NCTU01980012016-06-27T16:08:59Z http://ndltd.ncl.edu.tw/handle/98554357850637484363 The Carrier Transport Properties in Horizontal Conjugated Polymer Devices 共軛高分子水平元件中電荷傳輸特性 Yi-Chun Lai 賴宜君 碩士 國立交通大學 物理研究所 90 In order to solve the problem of the low carrier mobility in conjugated polymer, we use EBL(electron beam lithography) to fabricate the horizontal device with the electrodes parallel to electric current direction. The horizontal device is made up of Au/MEH-PPV/Au, and the hole carriers transport along the intra-chain instead of inter-chain hopping. Therefore, it is expected that there will be less resistivity and higher carrier mobility. We change the distance between the Au electrodes, ranging from 0.9 micron to14.7 micron, and measure the current-voltage curve to get the hole mobility in the horizontal device. It is found that the carrier mobility is about 102 to 103 much larger than the traditional sandwich structure. Besides, there is little dependence between the hole mobility and carrier transport distance. As the electrode distance is changed, we also change the measurement temperature to understand the temperature dependence of hole mobility. With the decrease of the temperature, the hole mobility decreases exponentially. In addition, the thermal activation energy gap is approximately half of that of the sandwich device. Hsin-Fei Meng Sheng-Fu Horng 孟心飛 洪勝富 2002 學位論文 ; thesis 62 zh-TW |
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碩士 === 國立交通大學 === 物理研究所 === 90 === In order to solve the problem of the low carrier mobility in conjugated polymer, we use EBL(electron beam lithography) to fabricate the horizontal device with the electrodes parallel to electric current direction. The horizontal device is made up of Au/MEH-PPV/Au, and the hole carriers transport along the intra-chain instead of inter-chain hopping. Therefore, it is expected that there will be less resistivity and higher carrier mobility. We change the distance between the Au electrodes, ranging from 0.9 micron to14.7 micron, and measure the current-voltage curve to get the hole mobility in the horizontal device. It is found that the carrier mobility is about 102 to 103 much larger than the traditional sandwich structure. Besides, there is little dependence between the hole mobility and carrier transport distance. As the electrode distance is changed, we also change the measurement temperature to understand the temperature dependence of hole mobility. With the decrease of the temperature, the hole mobility decreases exponentially. In addition, the thermal activation energy gap is approximately half of that of the sandwich device.
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author2 |
Hsin-Fei Meng |
author_facet |
Hsin-Fei Meng Yi-Chun Lai 賴宜君 |
author |
Yi-Chun Lai 賴宜君 |
spellingShingle |
Yi-Chun Lai 賴宜君 The Carrier Transport Properties in Horizontal Conjugated Polymer Devices |
author_sort |
Yi-Chun Lai |
title |
The Carrier Transport Properties in Horizontal Conjugated Polymer Devices |
title_short |
The Carrier Transport Properties in Horizontal Conjugated Polymer Devices |
title_full |
The Carrier Transport Properties in Horizontal Conjugated Polymer Devices |
title_fullStr |
The Carrier Transport Properties in Horizontal Conjugated Polymer Devices |
title_full_unstemmed |
The Carrier Transport Properties in Horizontal Conjugated Polymer Devices |
title_sort |
carrier transport properties in horizontal conjugated polymer devices |
publishDate |
2002 |
url |
http://ndltd.ncl.edu.tw/handle/98554357850637484363 |
work_keys_str_mv |
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