Low Power Testing for CMOS Logic Testing

博士 === 國立成功大學 === 電機工程學系 === 90 === The increasing transistor density and operating speed in the system-on-a-chip (SOC) era make the power dissipation during test a critical issue. This dissertation proposes four techniques to reduce the power dissipation in test application time for CMOS...

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Bibliographic Details
Main Authors: Tsung-Chu Huang, 黃宗柱
Other Authors: Kuen-Jong Lee
Format: Others
Language:en_US
Published: 2002
Online Access:http://ndltd.ncl.edu.tw/handle/23446931835307075746

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