Redundancy Selection Algorithm for Memory Reconfiguration
碩士 === 長庚大學 === 半導體研究所 === 90 === With the progression of semiconductor production and computer technology in recent years, memory capacity has increased rapidly, even more than 512MB. Large memory size will require a long time for deciding the repair solution, which makes it become an important wor...
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| Format: | Others |
| Language: | zh-TW |
| Published: |
2002
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| Online Access: | http://ndltd.ncl.edu.tw/handle/46629555340264723424 |
| Summary: | 碩士 === 長庚大學 === 半導體研究所 === 90 === With the progression of semiconductor production and computer technology in recent years, memory capacity has increased rapidly, even more than 512MB. Large memory size will require a long time for deciding the repair solution, which makes it become an important work to fast seeking solutions for memory reconfiguration.
In many conventional methods of seeking repair solutions, one method is called “Effective Coefficient”; it mainly counts the weighting of faulty line and then decides the repair sequence of memory. This paper modifies the loophole of the definition of Effective Coefficient, and proposes a new method the modified Effective Coefficient to search for the repair solutions simultaneously. The new method is to find out the more important faulty line by the faulty connected component of leading faulty cell and then repair it in prior. The new method has better performance in the capacity of searching solutions and execution speed as compared to the conventional method of using “Effective Coefficient”.
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