The Deformation Study of CVD Diamond Lead Bond Tool at Elevated Temperature Using Electronic Speckle Pattern Interferometry

碩士 === 國立中正大學 === 機械系 === 90 === Because the characteristics of non-destructive , non-contact and whole-field measurement, optical metrology quickly becomes the important measurement technique in the experiment mechanics. The most important reason is that the optical metrology has the hi...

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Bibliographic Details
Main Authors: Wei-Shu Wang, 王偉書
Other Authors: Song-Ren Huang
Format: Others
Language:zh-TW
Published: 2002
Online Access:http://ndltd.ncl.edu.tw/handle/99536680638674573690