通訊用發光元件之響應速率分析

• Main Authors: Shih-Feng Huang, 黃士峰
• Other Authors: 高進興
• Format: Others
• Language: zh-TW
• Published: 2002
• Online Access: http://ndltd.ncl.edu.tw/handle/55902847354188949272

碩士 === 國防大學中正理工學院 === 電子工程研究所 === 90 === The purpose of this thesis is to analyze the behaviors of vertical cavity surface emitting laser（VCSEL）for opto-communication. This thesis is divided into two major parts: First, using metal organic chemical vapor deposition（MOCVD）to fabricate VCSEL experimental samples by controlling the critical process, that is the cladding layer and the barrier layer fabrication. The main parameter for the process is to control the mole ratio of three metal organic vapors, which include Ga(CH3)3, Al(CH3)3 and AsH3. This thesis used low-temperature photoluminescence to detector the epitaxy layer quality of layers in the VCSEL structure, and it was found from the measurement results that VCSEL has the best quality if the mole ratio of the cladding layer and the barrier layer were 52.7 and 90, respectively. The other major part of this thesis was to setup an experimental system to measure transient time response for opto-communication devices, the aforementioned system is able to measure up to 20 pico-second of the rise time. In order to accurately measure the response time of VCSEL samples, five different analyzing methodologies were employed. 1. The standard deviation rise time method. 2. The 10-90% rise time method. 3. The 20-80% rise time method. 4. The center slope rise time method. 5. The maximum slope rise time method. It was found from experimental data that the traditional 10-90% rise time method produced maximum 21% error. However the standard deviation rise time method minimized error to 2.89%, which is the smallest in the five methodologies.