The simulation of V(Z) curve and it's application to isotropic materials using a lensless line-focus acoustic microscope
碩士 === 國立臺灣大學 === 應用力學研究所 === 89 === The V(Z,t) curve and V(Z) curve of a lens-less line focus acoustic microscope is simulated in order to characterize material constants by using the acoustic microscope. Only isotropic, homogeneous, linear and elastic materials are considered in this st...
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ndltd-TW-089NTU004990672016-07-04T04:17:15Z http://ndltd.ncl.edu.tw/handle/03254322114089393254 The simulation of V(Z) curve and it's application to isotropic materials using a lensless line-focus acoustic microscope 無鏡頭式線聚焦超音波顯微鏡V(Z)曲線之模擬於等向性試體之應用 Jyh-Horng Wu 吳志弘 碩士 國立臺灣大學 應用力學研究所 89 The V(Z,t) curve and V(Z) curve of a lens-less line focus acoustic microscope is simulated in order to characterize material constants by using the acoustic microscope. Only isotropic, homogeneous, linear and elastic materials are considered in this study. The incident field of the acoustic microscope and the reflection field are first derived from the full wave equation. A electro-mechanical reciprocity theorem is then used to construct V(Z) and V(Z,t) curves theoretically. The computed V(Z) curves are finally used together with genetic algorithm to characterize material. The wave speeds of Rayleigh surface waves, the longitudinal waves, the transverse waves, and/or the thickness of the layer are characterized successfully. Mao-Kuen Kuo 郭茂坤 2001 學位論文 ; thesis 86 zh-TW |
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碩士 === 國立臺灣大學 === 應用力學研究所 === 89 === The V(Z,t) curve and V(Z) curve of a lens-less line focus acoustic microscope is simulated in order to characterize material constants by using the acoustic microscope. Only isotropic, homogeneous, linear and elastic materials are considered in this study.
The incident field of the acoustic microscope and the reflection field are first derived from the full wave equation. A electro-mechanical reciprocity theorem is then used to construct V(Z) and V(Z,t) curves theoretically. The computed V(Z) curves are finally used together with genetic algorithm to characterize material. The wave speeds of Rayleigh surface waves, the longitudinal waves, the transverse waves, and/or the thickness of the layer are characterized successfully.
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Mao-Kuen Kuo |
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Mao-Kuen Kuo Jyh-Horng Wu 吳志弘 |
author |
Jyh-Horng Wu 吳志弘 |
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Jyh-Horng Wu 吳志弘 The simulation of V(Z) curve and it's application to isotropic materials using a lensless line-focus acoustic microscope |
author_sort |
Jyh-Horng Wu |
title |
The simulation of V(Z) curve and it's application to isotropic materials using a lensless line-focus acoustic microscope |
title_short |
The simulation of V(Z) curve and it's application to isotropic materials using a lensless line-focus acoustic microscope |
title_full |
The simulation of V(Z) curve and it's application to isotropic materials using a lensless line-focus acoustic microscope |
title_fullStr |
The simulation of V(Z) curve and it's application to isotropic materials using a lensless line-focus acoustic microscope |
title_full_unstemmed |
The simulation of V(Z) curve and it's application to isotropic materials using a lensless line-focus acoustic microscope |
title_sort |
simulation of v(z) curve and it's application to isotropic materials using a lensless line-focus acoustic microscope |
publishDate |
2001 |
url |
http://ndltd.ncl.edu.tw/handle/03254322114089393254 |
work_keys_str_mv |
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