薄膜厚度與組成對磁光薄膜GdFeCo與TbFeCo性質之影響

碩士 === 國立清華大學 === 材料科學工程學系 === 89 === This thesis focuses on “ How the thickness and composition variations of sputtered magneto-optic thin-film “Gdx(Fe80Co20)1-x and Tbx(Fe80Co20)1-x affect the magnetic properties, such as coercivity、saturated magnetization、perpendicular anisotropy const...

Full description

Bibliographic Details
Main Authors: Tzo-Yin Chiu, 邱子茵
Other Authors: Chih-Huang Lai
Format: Others
Language:zh-TW
Published: 2001
Online Access:http://ndltd.ncl.edu.tw/handle/35072597609377746054
id ndltd-TW-089NTHU0159076
record_format oai_dc
spelling ndltd-TW-089NTHU01590762016-01-29T04:33:41Z http://ndltd.ncl.edu.tw/handle/35072597609377746054 薄膜厚度與組成對磁光薄膜GdFeCo與TbFeCo性質之影響 Tzo-Yin Chiu 邱子茵 碩士 國立清華大學 材料科學工程學系 89 This thesis focuses on “ How the thickness and composition variations of sputtered magneto-optic thin-film “Gdx(Fe80Co20)1-x and Tbx(Fe80Co20)1-x affect the magnetic properties, such as coercivity、saturated magnetization、perpendicular anisotropy constant and exchanging coupling constant etc.. The relation between these magnetic properties, like perpendicular anisotropy constant and saturated magnetization, perpendicular anisotropy constant and exchanging coupling constant etc., are also systematically investigated. In addition, the dependence of the domain structures on the thickness and composition of the thin films was clarified by using magnetic force microscope. The experimental results indicate that the tendency of magnetic properties toward increasing thickness for the TM-rich media is opposite to that for the RE-rich. This difference between TM-rich and RE-rich media is mainly due to the exchange-couple constants of RE atoms and TM atoms are not equal to each other at different thin film thickness. And the correlations of magnetic properties versus composition can be divided into two parts by setting the compensation composition point being the dividing point. For example , the saturated magnetization is the smallest at compensation composition point compared to other composition. As the composition get leaving this compensation point, the saturated magnetization will get increasing. Furthermore, the observations of the domain structures by using MFM exhibit that the variation of thin-film thickness affects the domain structure significantly because the thicker thin film produce more incoherent spots, as the defects during the domain reversal process. It further results in the smaller domain structure in the thicker film than that in the thinner. Chih-Huang Lai 賴志煌 2001 學位論文 ; thesis 80 zh-TW
collection NDLTD
language zh-TW
format Others
sources NDLTD
description 碩士 === 國立清華大學 === 材料科學工程學系 === 89 === This thesis focuses on “ How the thickness and composition variations of sputtered magneto-optic thin-film “Gdx(Fe80Co20)1-x and Tbx(Fe80Co20)1-x affect the magnetic properties, such as coercivity、saturated magnetization、perpendicular anisotropy constant and exchanging coupling constant etc.. The relation between these magnetic properties, like perpendicular anisotropy constant and saturated magnetization, perpendicular anisotropy constant and exchanging coupling constant etc., are also systematically investigated. In addition, the dependence of the domain structures on the thickness and composition of the thin films was clarified by using magnetic force microscope. The experimental results indicate that the tendency of magnetic properties toward increasing thickness for the TM-rich media is opposite to that for the RE-rich. This difference between TM-rich and RE-rich media is mainly due to the exchange-couple constants of RE atoms and TM atoms are not equal to each other at different thin film thickness. And the correlations of magnetic properties versus composition can be divided into two parts by setting the compensation composition point being the dividing point. For example , the saturated magnetization is the smallest at compensation composition point compared to other composition. As the composition get leaving this compensation point, the saturated magnetization will get increasing. Furthermore, the observations of the domain structures by using MFM exhibit that the variation of thin-film thickness affects the domain structure significantly because the thicker thin film produce more incoherent spots, as the defects during the domain reversal process. It further results in the smaller domain structure in the thicker film than that in the thinner.
author2 Chih-Huang Lai
author_facet Chih-Huang Lai
Tzo-Yin Chiu
邱子茵
author Tzo-Yin Chiu
邱子茵
spellingShingle Tzo-Yin Chiu
邱子茵
薄膜厚度與組成對磁光薄膜GdFeCo與TbFeCo性質之影響
author_sort Tzo-Yin Chiu
title 薄膜厚度與組成對磁光薄膜GdFeCo與TbFeCo性質之影響
title_short 薄膜厚度與組成對磁光薄膜GdFeCo與TbFeCo性質之影響
title_full 薄膜厚度與組成對磁光薄膜GdFeCo與TbFeCo性質之影響
title_fullStr 薄膜厚度與組成對磁光薄膜GdFeCo與TbFeCo性質之影響
title_full_unstemmed 薄膜厚度與組成對磁光薄膜GdFeCo與TbFeCo性質之影響
title_sort 薄膜厚度與組成對磁光薄膜gdfeco與tbfeco性質之影響
publishDate 2001
url http://ndltd.ncl.edu.tw/handle/35072597609377746054
work_keys_str_mv AT tzoyinchiu báomóhòudùyǔzǔchéngduìcíguāngbáomógdfecoyǔtbfecoxìngzhìzhīyǐngxiǎng
AT qiūziyīn báomóhòudùyǔzǔchéngduìcíguāngbáomógdfecoyǔtbfecoxìngzhìzhīyǐngxiǎng
_version_ 1718173298724962304