Electrical Characterization of Thermoelectric Materials

• Main Authors: Chen Chin Hsun, 陳志勳
• Other Authors: 吳慶成
• Format: Others
• Language: zh-TW
• Published: 2001
• Online Access: http://ndltd.ncl.edu.tw/handle/53971142116608355778

碩士 === 國立東華大學 === 材料科學與工程研究所 === 89 === A self-established Hall measurement system is used to characterize the electrical properties (electric resistivity, carrier concentration, Hall coefficient and Hall mobility) of three popular thermoelectric materials, (Bi1-xSbx)2Te3, Bi2Te3-xSex and Zn4Sb3. The temperature range of Hall measurements was performed between 170K and 350K. In this work, the samples were prepared by vertical Bridgman method and hot press method. Sample quality and crystal structures were examined by X-ray, SEM and EPMA. The composition and temperature dependence of the electrical resistivity, carrier concentration, Hal coefficient and Hall mobility of these materials were discussed.