C-V Characterization Measurementof C60 Films

碩士 === 中原大學 === 應用物理研究所 === 89 === Abstract In this report, by using by C-V measurement at frequency 1M Hz from 20 K to 300 K, we measure the relations of the dielectric constant κ , ac conductance σ and dielectric relaxation time constant τ with respect to temperature of C60 sandwiched sample...

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Bibliographic Details
Main Authors: Cheng-Hua Hsiao, 蕭檉譁
Other Authors: K. C. Chiu
Format: Others
Language:zh-TW
Published: 2001
Online Access:http://ndltd.ncl.edu.tw/handle/83692931209115954896
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Summary:碩士 === 中原大學 === 應用物理研究所 === 89 === Abstract In this report, by using by C-V measurement at frequency 1M Hz from 20 K to 300 K, we measure the relations of the dielectric constant κ , ac conductance σ and dielectric relaxation time constant τ with respect to temperature of C60 sandwiched sample ( Au / C60 / Au ). The dielectric constant of C60 is 4.3 ±0.2 at room temperature, which is close to the published results. From the curve of dielectric constant versus temperature, we have observed that the changes due to order / disorder phase transition and glass transition. Meanwhile, by using the Arrhenius plot of lnτversus 1000 / T, the values of activation energy are calculated to be 112 meV (fcc) and 256 meV (sc) with respect to the rotational order / disorder phase transition respectively.