The study of multiple test for optimum test yield, test quality and tester accuracy
碩士 === 中華大學 === 電機工程學系碩士班 === 89 === This thesis introduces how a test system works. It contains the derivation of relationships of test yield and test quality for the varied specification requirement including single-test, two-test, repeat-test and multiple-test. By the results, it is sh...
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| Format: | Others |
| Language: | zh-TW |
| Published: |
2001
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| Online Access: | http://ndltd.ncl.edu.tw/handle/85198657545416650019 |
| Summary: | 碩士 === 中華大學 === 電機工程學系碩士班 === 89 === This thesis introduces how a test system works. It contains the derivation of relationships of test yield and test quality for the varied specification requirement including single-test, two-test, repeat-test and multiple-test. By the results, it is shown that test guardband and tester accuracy strongly affect test yield and test quality. Use of the tester with great accuracy will increase both the test yield and test quality. If we set a large guardband, we will get a great quality but lower test yield. By the way of multiple-test, more high test-yield or more high quality are reachable. Using a less accurate tester, it also can reach the same test-yield and quality level by the multiple-test.
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