| Summary: | 碩士 === 元智大學 === 工業工程研究所 === 88 === During the manufacturing processes of PCBs, some defective products are often found not because of merely one, single factor but because of two or more manufacturing factors interacting with each other. To find out the main factor of the defective products caused by many factors is not an easy task. Nor is it easy to set up a standard mold to provide a quick check-up and a solution at the same time. When these defective questions come up, they are presently solved either through the accumulated experiences of the senior staff or through the application of Cause and Effect Diagram (CAED). Hence, the enterprise will encounter two major obstacles: one is the limited time; the other is the handing down of experiences. In an aggressively competitive society, these two obstacles will cause a great lost to the enterprise. To reinforce the analytical abilities of the CAED, we may set up an information database of the many important manufacturing phases of the past defective products. By comparing every important present manufacturing phase with the previous defective ones, we can find out if there is any similarity in the manufacturing process of the present defective products. Through observing the corresponding manufacturing processes, should there be any similarities, the managerial staff can take the original improving policy into consideration in making the present defective manufacturing processes better. In doing so, the managerial staff can make a quick judgment of the CAED and execute it precisely to make the analysis
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