Design and Construction of a 3D ESPI and Shearographic System
碩士 === 國立臺灣大學 === 應用力學研究所 === 88 === Electronics Speckle Pattern Interferometry (ESPI) and Electronics Speckle Pattern Shearing Interferometry (ESPSI) are two of the few contemporary metrology methodologies that can be used to measure in-plane and out-of-plane deformation field simultaneously. To t...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | zh-TW |
| Published: |
2000
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| Online Access: | http://ndltd.ncl.edu.tw/handle/61923823780442209971 |