The Development of an Automatic Testing System and Reliability Analysis for Laser Diode

• Main Authors: Yang-Bin Lin, 林揚斌
• Other Authors: 劉萬榮
• Format: Others
• Language: zh-TW
• Published: 2000
• Online Access: http://ndltd.ncl.edu.tw/handle/07124966160843759482

碩士 === 國立海洋大學 === 光電科學研究所 === 88 === With the advance of semiconductor technology , semiconductor for laser diodes are widely used on many different applications. Consequently , the quality and lifetime of laser diodes are important issues which can hardly be ignore . In the past , the quality and lifetime of laser diodes were measure factitiously , which is quite wasting time and human power. An automatic lifetime and quality testing system of laser diodes is designed and developed in this thesis. This system is controlled by personal computer. The burning data of different temperature of laser diode are fetched via standard 8255 I/O interface. We finally develop a mathematically model to predict the lifetime of laser diodes . The predicted lifetime of laser diodes were also verified in this thesis.