The Development of an Automatic Testing System and Reliability Analysis for Laser Diode
碩士 === 國立海洋大學 === 光電科學研究所 === 88 === With the advance of semiconductor technology , semiconductor for laser diodes are widely used on many different applications. Consequently , the quality and lifetime of laser diodes are important issues which can hardly be ignore . In the past , the quality and l...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | zh-TW |
| Published: |
2000
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| Online Access: | http://ndltd.ncl.edu.tw/handle/07124966160843759482 |